Redundancy effect on yield of binary tree RAMs

Bruno Ciciani


Published in: Journal of Electronic Testing, 1991
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Abstract:

BibTeX Entry:

@article{Cic91b,
title = {Redundancy effect on yield of binary tree RAMs},
author = {Ciciani, Bruno},
journal = {Journal of Electronic Testing},
volume = {2},
number = {3},
pages = {293--306},
year = {1991},
publisher = {Springer}
}